Development of Image Based Defect Detection Prototype Network Using Artificial Intelligence Deep Learning Methods

Project Description

We are a US-based research and development company owned by global leader and multinational corporation.

We are exploring the use of deep learning artificial intelligence techniques to add the capability to automatically detect defects in images. 

Our team of researchers is currently learning and exploring the field of deep learning AI techniques and models, as potentially applicable to our current application.  There are many different model architectures and many parameters available to tune within each model. Exploring this rapidly expanding research space to find AI networks that are highly appropriate for our application may take a long time. 

Expertise Neeeded: (Please see attachment for more details)

We are looking for consulting expertise that can accelerate our development of a solution.  An appropriate consultant would have experience selecting deep neural network architectures and then developing, optimizing, and applying such networks to images for recognition applications.

Your proposal: 

• What is your background and qualifications for this project?
• Please describe your past experience performing similar work and using deep learning techniques for image analysis, including any available references or publications.
• Please tell us how you would approach developing a solution for this project application.
• Please include a high level plan/timeline